Defence NSN Source is a one-stop shop for Semiconductor Devices Unitized components and other similar products that meet the needs of our customer base. You have taken a specific interest in part number 1N6657LTXV, a Solid State Devices Inc offering we carry that is listed alongside the NSN 5961-01-391-3735 to streamline identification and procurement. If you fill out and submit the Request for Quote (RFQ) form located below, you can secure pricing options for your comparisons. Within 15 minutes of one of our team members receiving and reviewing your submission, you can anticipate a customized response.
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We strive to make the procurement process more straightforward and efficient by offering comprehensive details for listed components whenever possible. For instance, part number 1N6657LTXV was manufactured by Solid State Devices Inc under the CAGECode 30043. Moreover, by using the first digits of the NSN 5961-01-391-3735, we can see that this product belongs to FSC 5961 Semiconductor Devices and Associated Hardware. Utilizing such information, you can ensure that you are securing precisely what you need to carry out operations or meet your project requirements. Keeping this in mind, obtain a quote on part number 1N6657LTXV with our online services.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-01-391-3735 Item PartTypeName: SEMICONDUCTOR DEVICES,UNITIZED | 5961 | 013913735 | 0 | N | A | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | A | G | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| PRD3099 | 5 | 9 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | CERAMIC |
| ABMK | OVERALL WIDTH | 0.545 INCHES MAXIMUM |
| ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | TO-254AA |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 100.0 MAXIMUM REVERSE VOLTAGE,INSTANTANEOUS ALL SEMICONDUCTOR DEVICE DIODE AND 100.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE ALL SEMICONDUCTOR DEVICE DIODE |
| TEST | TEST DATA DOCUMENT | 35351-171280 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWI |
| PMLC | PRECIOUS MATERIAL AND LOCATION | TERMINAL AREAS IAW MIL-STD-2000 PARA. 5.4.17.2 GOLD |
| PRMT | PRECIOUS MATERIAL | GOLD |
| TTQY | TERMINAL TYPE AND QUANTITY | 3 PIN |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 40.00 AMPERES FORWARD CURRENT,AVERAGE ABSOLUTE ALL SEMICONDUCTOR DEVICE DIODE AND 400.00 AMPERES FORWARD CURRENT,AVERAGE PRESET ALL SEMICONDUCTOR DEVICE DIODE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 175.0 DEG CELSIUS JUNCTION |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
| ABHP | OVERALL LENGTH | 0.990 INCHES MAXIMUM |
| ABKW | OVERALL HEIGHT | 0.560 INCHES MAXIMUM |
| AKPV | MOUNTING FACILITY QUANTITY | 4 |
| ASCK | RESPONSE TIME | 35.0 NANOSECONDS MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| AXGY | MOUNTING METHOD | TERMINAL AND UNTHREADED HOLE |
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